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  1. Kratos Analytical - start point for Surface Analysis, turbopumps and MALDI

    Kratos manufactures XPS (ESCA), reflectron MALDI TOF, XRD, and XRF instruments for research and routine use and their data systems
    XPS1
    XRF1
    TOF1
    XRD1
    ESCA1
    surface analysis1
    MALDI1
    imaging ESCA1
    XPS mapping1

    www.kratos.com - 2009-02-07

  2. Ionoptika Ltd

    Your browser does not support frames. Please update your browser to the latest release.
    sims2
    mass spectrometry1
    tof1
    vacuum equipment1
    pulser1
    surface analysis1
    C601
    buncher1
    time of flight1
    ion sources1
    Ion beam systems1
    LMIS1
    ion guns1
    Duoplasmatron1
    LMIG1
    static sims1
    Gallium LMIG0
    Liquid metal ion sources0
    quadrupole sims0
    sector sims0

    www.ionoptika.com - 2009-02-07

  3. TASCON Gesellschaft für Oberflächen- und Materialcharakterisierung mbH, Münster

    TASCON ist Spezialist für die Oberflächen- und Materialanalyse. Dazu setzen wir TOF-SIMS, XPS, AFM und REM ein
    SEM3
    Analysen2
    sims2
    polymers2
    Reverse Engineering1
    spectroscopy1
    Failure analysis1
    REM1
    Analytik1
    XPS1
    Polymere1
    Analytical Services1
    tof1
    Spektroskopie1
    Surface analysis1
    Materialanalyse1
    Fehleranalyse1
    Material analysis1
    Auftragsanalytik1
    depth profile1
    TOF-SIMS1
    Materialanalysen1
    Werkstoffanalysen1
    Tiefenprofil1
    Material characterisation1
    Mikrobereichsanalysen1
    Oberflächenanalysen1
    Schichtanalysen1
    Mikrobereichsanalyse1
    spectromety1
    Spektometrie1

    www.surface-analysis.eu - 2009-02-10

  4. SPECS - Your competent partner in Surface Analysis - Components and Systems

    SPECS - Your competent partner in Surface Analysis - Components and Systems
    systems4
    Analysis3
    UPS3
    components3
    Surface2
    LEED2
    SPECS2
    Detectors2
    AES1
    ISS1
    MBE1
    spectroscopy1
    SPM1
    STM1
    XPS1
    ToF1
    ESCA1
    Thin Film Deposition1
    LEEM1
    Surface Analysis1
    THEMIS1
    ion source1
    plasma source1
    atom source1
    Oberflächenanalytik1
    uv source1
    x-ray source1
    LT-STM1
    photoelectron spectroscopy1
    hemispherical analyser0
    hemispherical analyzer0
    Homepage of SPECS GmbH0

    www.specs.de - 2009-03-09

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